Time-of-flight neutron diffraction investigation of temperature factors in the Zn blende semiconductor InP

✍ Scribed by C. Ferrari; C. Bocchi; O. Moze; C.C. Wilson; R. Fornari

• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 207 KB
• Volume: 180-181
• Category: Article
• ISSN: 0921-4526
• DOI: 10.1016/0921-4526(92)90415-o