✦ LIBER ✦
Time dependent dielectric breakdown measurement of high pressure low temperature oxidized film : M. Hirayama, T. Matsukawa, N. Tsubouchi and H. Nakata. Proc. IEEE Reliab. Phys. Conf. 146 (1984)
- Publisher
- Elsevier Science
- Year
- 1985
- Tongue
- English
- Weight
- 133 KB
- Volume
- 25
- Category
- Article
- ISSN
- 0026-2714
No coin nor oath required. For personal study only.