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Time-dependent dielectric breakbown evaluation for rapid-thermally grown SiO2 films formed on submicron-grooved Si surfaces

✍ Scribed by T. Arakawa; H. Fukuda; Y. Okabe; S. Ohno


Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
541 KB
Volume
103
Category
Article
ISSN
0022-0248

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