✦ LIBER ✦
Time dependence of charge losses at the Si–SiO2 interface in p+n-silicon strip sensors
✍ Scribed by Poehlsen, Thomas; Fretwurst, Eckhart; Klanner, Robert; Schwandt, Joern; Zhang, Jiaguo
- Book ID
- 123337837
- Publisher
- Elsevier Science
- Year
- 2013
- Tongue
- English
- Weight
- 865 KB
- Volume
- 731
- Category
- Article
- ISSN
- 0168-9002
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