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Tilt scanning interferometry: a numerical simulation benchmark for 3D metrology

✍ Scribed by Galizzi, Gustavo E. ;Ruiz, Pablo D. ;Kaufmann, Guillermo H.


Book ID
115354438
Publisher
The Optical Society
Year
2009
Tongue
English
Weight
752 KB
Volume
48
Category
Article
ISSN
1559-128X

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