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Tightly focused epimicroscope technique for submicrometer-resolved highly sensitive refractive index measurement of an optical waveguide

✍ Scribed by Youk, Youngchun ;Kim, Dug Young


Book ID
115353430
Publisher
The Optical Society
Year
2007
Tongue
English
Weight
425 KB
Volume
46
Category
Article
ISSN
1559-128X

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