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Tight-binding scheme for impurity states in semiconductors

✍ Scribed by Menchero, J. G.; Capaz, R. B.; Koiller, Belita; Chacham, H.

Book ID: 121456746
Publisher: The American Physical Society
Year: 1999
Tongue: English
Weight: 107 KB
Volume: 59
Category: Article
ISSN: 1098-0121
DOI: 10.1103/PhysRevB.59.2722

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4. Point defects in bulk semiconductors 4.1 Crystalline materials 4.1.1 Defect molecule models 4.1.2 Transition metal impurities 4.1.3 Rare-earth impurities 4.2 Hydrogenic impurity states in doped amorphous silicon 5. Interface defects for oxidized Si nanocrystals 5.1 Self-trapped excitons 5.2 Oxyge