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Tight-binding model for semiconductor nanostructures

โœ Scribed by Schulz, S.; Czycholl, G.


Book ID
120276706
Publisher
The American Physical Society
Year
2005
Tongue
English
Weight
494 KB
Volume
72
Category
Article
ISSN
1098-0121

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Tight Binding for Complex Semiconductor
โœ C. Delerue; M. Lannoo; G. Allan ๐Ÿ“‚ Article ๐Ÿ“… 2001 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 464 KB

4. Point defects in bulk semiconductors 4.1 Crystalline materials 4.1.1 Defect molecule models 4.1.2 Transition metal impurities 4.1.3 Rare-earth impurities 4.2 Hydrogenic impurity states in doped amorphous silicon 5. Interface defects for oxidized Si nanocrystals 5.1 Self-trapped excitons 5.2 Oxyge