✦ LIBER ✦
Threshold voltage shift in 0.1 μm self-aligned-gate GaAs MESFETs under bias stress and related degradation of ultra-high-speed digital ICs
✍ Scribed by Yoshino K. Fukai; Kimiyoshi Yamasaki; Kazumi Nishimura
- Book ID
- 108362465
- Publisher
- Elsevier Science
- Year
- 1999
- Tongue
- English
- Weight
- 184 KB
- Volume
- 39
- Category
- Article
- ISSN
- 0026-2714
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