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Threshold voltage sensitivity of 0.1 μm channel length fully-depleted SOI NMOSFET's with back-gate bias

✍ Scribed by Leobandung, E.; Chou, S.Y.


Book ID
114536168
Publisher
IEEE
Year
1995
Tongue
English
Weight
316 KB
Volume
42
Category
Article
ISSN
0018-9383

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