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Threshold voltage roll-up/roll-off characteristic control in sub-0.2-μm single workfunction gate CMOS for high-performance DRAM applications

✍ Scribed by Inaba, S.; Katsumata, R.; Akatsu, H.; Rengarajan, R.; Ronsheim, P.; Murthy, C.S.; Sunouchi, K.; Bronner, G.B.


Book ID
114539000
Publisher
IEEE
Year
2002
Tongue
English
Weight
156 KB
Volume
49
Category
Article
ISSN
0018-9383

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