✦ LIBER ✦
Threshold voltage models of the narrow-gate effect in micron and submicron MOSFETs : Steve Shao-Shiun Chung and Chih-Tang Sah. Solid-St. Electron. 31, 1009 (1988)
- Publisher
- Elsevier Science
- Year
- 1989
- Tongue
- English
- Weight
- 133 KB
- Volume
- 29
- Category
- Article
- ISSN
- 0026-2714
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