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Threshold voltage mismatch and intra-die leakage current in digital CMOS circuits

✍ Scribed by Pineda de Gyvez, J.; Tuinhout, H.P.

Book ID: 119799259
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 649 KB
Volume: 39
Category: Article
ISSN: 0018-9200
DOI: 10.1109/jssc.2003.820873

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