Threshold voltage instability of MOS field effect transistors : Sesha R. Shankar, Raj P. Misra and Henry T. Rand. Microelectron. Reliab. 17, 305 (1978)

• Publisher: Elsevier Science
• Year: 1978
• Tongue: English
• Weight: 115 KB
• Volume: 17
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(78)90347-5