✦ LIBER ✦
Threshold-Voltage Instability Due to Damage Recovery in Nanoscale NAND Flash Memories
✍ Scribed by Miccoli, C.; Compagnoni, C.M.; Beltrami, S.; Spinelli, A.S.; Visconti, A.
- Book ID
- 114620528
- Publisher
- IEEE
- Year
- 2011
- Tongue
- English
- Weight
- 474 KB
- Volume
- 58
- Category
- Article
- ISSN
- 0018-9383
No coin nor oath required. For personal study only.