✦ LIBER ✦
Threshold Voltage Fluctuation by Random Telegraph Noise in Floating Gate nand Flash Memory String
✍ Scribed by Sung-Min Joe; Jeong-Hyong Yi; Sung-Kye Park; Hyungcheol Shin; Byung-Gook Park; Young June Park; Jong-Ho Lee
- Book ID
- 114620255
- Publisher
- IEEE
- Year
- 2011
- Tongue
- English
- Weight
- 917 KB
- Volume
- 58
- Category
- Article
- ISSN
- 0018-9383
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