✦ LIBER ✦
Threshold voltage degradation under high Vgs and low Vds on 200 V SOI power devices
✍ Scribed by Qinsong Qian; Siyang Liu; Weifeng Sun; Hu Sun
- Publisher
- Elsevier Science
- Year
- 2011
- Tongue
- English
- Weight
- 845 KB
- Volume
- 42
- Category
- Article
- ISSN
- 0026-2692
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