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Threshold voltage and inversion charge modeling of graded SiGe-channel modulation-doped p-MOSFETs

✍ Scribed by Niu, G.F.; Ruan, D.G.


Book ID
114536391
Publisher
IEEE
Year
1995
Tongue
English
Weight
580 KB
Volume
42
Category
Article
ISSN
0018-9383

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