✦ LIBER ✦
Threshold voltage and C-V characteristics of SOI MOSFET's related to Si film thickness variation on SIMOX wafers
✍ Scribed by Chen, J.; Solomon, R.; Chan, T.-Y.; Ko, P.K.; Hu, C.
- Book ID
- 114534836
- Publisher
- IEEE
- Year
- 1992
- Tongue
- English
- Weight
- 828 KB
- Volume
- 39
- Category
- Article
- ISSN
- 0018-9383
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