Threshold energy effect on avalanche breakdown voltage in semiconductor junctions : Y. Okuto and C. R. Crowell. Solid-St. Electron. 18, 161 (1975)

• Publisher: Elsevier Science
• Year: 1975
• Tongue: English
• Weight: 125 KB
• Volume: 14
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(75)90186-9