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Threshold and probability of impact ionization by electrons in narrow-gapp-type semiconductors with highly degenerate holes

✍ Scribed by A. V. Dmitriev; A. B. Evlyukhin


Book ID
110118224
Publisher
SP MAIK Nauka/Interperiodica
Year
1997
Tongue
English
Weight
118 KB
Volume
39
Category
Article
ISSN
1063-7834

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