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Three- to two-dimensional transition in electrostatic screening of point charges at semiconductor surfaces studied by scanning tunneling microscopy

✍ Scribed by Laubsch, A.; Urban, K.; Ebert, Ph.


Book ID
121685915
Publisher
The American Physical Society
Year
2009
Tongue
English
Weight
405 KB
Volume
80
Category
Article
ISSN
1098-0121

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