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Three-dimensional structurization by additive lithography, analysis of deposits using TEM and EDX, and application to field-emitter tips

✍ Scribed by J. Kretz; M. Rudolph; M. Weber; H.W.P. Koops


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
496 KB
Volume
23
Category
Article
ISSN
0167-9317

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