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Three-dimensional grain mapping by x-ray diffraction contrast tomography and the use of Friedel pairs in diffraction data analysis

✍ Scribed by Ludwig, W.; Reischig, P.; King, A.; Herbig, M.; Lauridsen, E. M.; Johnson, G.; Marrow, T. J.; Buffiere, J. Y.


Book ID
115491282
Publisher
American Institute of Physics
Year
2009
Tongue
English
Weight
962 KB
Volume
80
Category
Article
ISSN
0034-6748

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