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Three-dimensional finite element analysis of N-port waveguide junctions using edge-elements

✍ Scribed by Wong, Man-Faï ;Picon, Odile ;Hanna, Victor Fouad

Publisher
John Wiley and Sons
Year
1993
Tongue
English
Weight
636 KB
Volume
3
Category
Article
ISSN
1050-1827

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✦ Synopsis

Abstract

The finite element method is formulated in such a way that the electromagnetic solution of an excited cavity formed from an N‐port waveguides junction leads directly and naturally to circuit characteristics of this junction. The use of edge‐elements eliminates nonphysical solutions. The reliability of the method is assured compared to a penalty method. Accuracy of the method is demonstrated through the presentation of results for a waveguide T‐junction, while its efficiency is proven through the presentation of results for two case studies of a finite step discontinuity and a finline T‐junction. © 1993 John Wiley & Sons, Inc.

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