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Three-dimensional Electrical Property Mapping with Nanometer Resolution

✍ Scribed by Alexander Alekseev; Anton Efimov; Kangbo Lu; Joachim Loos

Publisher: John Wiley and Sons
Year: 2009
Tongue: English
Weight: 356 KB
Volume: 21
Category: Article
ISSN: 0935-9648
DOI: 10.1002/adma.200901754

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