✦ LIBER ✦
Three-Dimensional Chemical Characterization of Electronic Materials || Transient Phenomena and Impurity Relocation in SIMS Depth Profiling using Oxygen Bombardment: Pursuing the Physics to Interpret the Data [and Discussion]
✍ Scribed by K. Wittmaack and I. W. Drummond
- Book ID
- 123646129
- Publisher
- The Royal Society
- Year
- 1996
- Tongue
- English
- Weight
- 925 KB
- Volume
- 354
- Category
- Article
- ISSN
- 0264-3952
- DOI
- 10.2307/54738
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