✦ LIBER ✦
Three-Dimensional Carrier Profiling of Individual Si Nanowires by Scanning Spreading Resistance Microscopy
✍ Scribed by Xin Ou; Pratyush Das Kanungo; Reinhard Kögler; Peter Werner; Ulrich Gösele; Wolfgang Skorupa; Xi Wang
- Publisher
- John Wiley and Sons
- Year
- 2010
- Tongue
- English
- Weight
- 491 KB
- Volume
- 22
- Category
- Article
- ISSN
- 0935-9648
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