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Thin oxide degradation after high-energy ion irradiation

✍ Scribed by Candelori, A.; Ceschia, M.; Paccagnella, A.; Wyss, J.; Bisello, D.; Ghidini, G.

Book ID: 114554963
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 199 KB
Volume: 48
Category: Article
ISSN: 0018-9499
DOI: 10.1109/23.960365

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