✦ LIBER ✦
Thin layers composition and impurities determination using low energy proton X-ray excitation: Applications to chalcogenide films stoichiometry and boron purification control
✍ Scribed by Jean Paul Thomas; Louis Porte; Jean Engerran; Jean Claude Viala; Jean Tousset
- Publisher
- Elsevier Science
- Year
- 1974
- Weight
- 558 KB
- Volume
- 117
- Category
- Article
- ISSN
- 0029-554X
No coin nor oath required. For personal study only.