𝔖 Bobbio Scriptorium
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Thin layer activation: A technique for monitoring material loss during high temperature surface degradation processes

✍ Scribed by J. Asher; M.J. Bennett; R.W.M. Hawes; J.B. Price; A.T. Tuson; D.J. Savage; S. Sugden


Publisher
Elsevier Science
Year
1987
Weight
580 KB
Volume
88
Category
Article
ISSN
0025-5416

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