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Thin insulator films chemically sensibilized by ion implantation for use in ISFETs: studies on the drift effect in NAS membranes

✍ Scribed by M.T. Pham; W. Hoffmann; J. Hüller


Book ID
108028679
Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
339 KB
Volume
8
Category
Article
ISSN
0925-4005

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