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Thin Film Structure of Tetraceno[2,3- b ]thiophene Characterized by Grazing Incidence X-ray Scattering and Near-Edge X-ray Absorption Fine Structure Analysis

✍ Scribed by Yuan, Quan; Mannsfeld, Stefan C. B.; Tang, Ming L.; Toney, Michael F.; Lüning, Jan; Bao, Zhenan

Book ID: 127091792
Publisher: American Chemical Society
Year: 2008
Tongue: English
Weight: 299 KB
Volume: 130
Category: Article
ISSN: 0002-7863
DOI: 10.1021/ja0773002

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