✦ LIBER ✦
Thin film silicon devices deposited at 100 °C: A study on the structural order of the photoactive layer
✍ Scribed by J.K. Rath; R.E.I. Schropp; Pere Roca i Cabarocas; F.D. Tichelaar
- Book ID
- 116671021
- Publisher
- Elsevier Science
- Year
- 2008
- Tongue
- English
- Weight
- 375 KB
- Volume
- 354
- Category
- Article
- ISSN
- 0022-3093
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