Thin-film characterization using a scanning laser acoustic microscope with surface acoustic waves : Robbins, W.P.; Mueller, R.K.; Rudd, E. IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, Vol. 35, No. 4, pp. 477–483 (Jul. 1988)

• Publisher: Elsevier Science
• Year: 1990
• Weight: 177 KB
• Volume: 23
• Category: Article
• ISSN: 0308-9126
• DOI: 10.1016/0308-9126(90)91494-e