Thin film analysis of chromium-phosphate conversion coatings on aluminium probed by ToF-SIMS and electron probe x-ray analysis

✍ Scribed by Erik Cuynen; Gudrun Goeminne; Pierre Van Espen; Herman Terryn

• Publisher: John Wiley and Sons
• Year: 2000
• Tongue: English
• Weight: 61 KB
• Volume: 30
• Category: Article
• ISSN: 0142-2421
• DOI: 10.1002/1096-9918(200008)30:1<589::aid-sia706>3.0.co;2-n