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Thin film analysis by X-ray scattering

โœ Scribed by John Leake


Book ID
113780005
Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
64 KB
Volume
58
Category
Article
ISSN
1044-5803

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With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of t

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With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of t

Thin Film Analysis by X-Ray Scattering (
โœ Birkholz, Mario ๐Ÿ“‚ Article ๐Ÿ“… 2006 ๐Ÿ› Wiley-VCH Verlag GmbH & Co. KGaA ๐ŸŒ German โš– 601 KB

With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of t

Thin Film Analysis by X-Ray Scattering (
โœ Birkholz, Mario ๐Ÿ“‚ Article ๐Ÿ“… 2006 ๐Ÿ› Wiley-VCH Verlag GmbH & Co. KGaA ๐ŸŒ German โš– 678 KB

Diffraction effects are observed when electromagnetic radiation impinges on periodic structures with geometrical variations on the length scale of the wavelength of the radiation. The interatomic distances in crystals and molecules amount to 0.15-0.4 nm which correspond in the electromagnetic spectr