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Thickness scan of metallic layer by photon induced X-ray emission

✍ Scribed by A. Kozela; A. Białek; K. Bodek; P. Gorel; St. Kistryn; E. Stephan; J. Zejma

Book ID: 108225871
Publisher: Elsevier Science
Year: 2011
Tongue: English
Weight: 512 KB
Volume: 269
Category: Article
ISSN: 0168-583X
DOI: 10.1016/j.nimb.2011.04.114

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