✦ LIBER ✦
Thickness measurements for ultrathin-film insulator metal–oxide–semiconductor structures using Fowler–Nordheim tunneling current oscillations
✍ Scribed by L. Mao; C. Tan; M. Xu
- Book ID
- 121830604
- Publisher
- American Institute of Physics
- Year
- 2000
- Tongue
- English
- Weight
- 209 KB
- Volume
- 88
- Category
- Article
- ISSN
- 0021-8979
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