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Thickness Measurement of Nanoscale Polymer Layer on Polymer Substrates by Attenuated Total Reflection Infrared Spectroscopy

✍ Scribed by Yang, Peng; Meng, Xiangfei; Zhang, Zhiyuan; Jing, Benxin; Yuan, Jing; Yang, Wantai

Book ID: 118273838
Publisher: American Chemical Society
Year: 2005
Tongue: English
Weight: 189 KB
Volume: 77
Category: Article
ISSN: 0003-2700
DOI: 10.1021/ac048869d

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