✦ LIBER ✦
Thickness determination of thin solid films by angle-resolved X-ray fluorescence spectrometry using monochromatized synchrotron radiation
✍ Scribed by W. Schmitt; P. Drotbohm; J. Rothe; J. Hormes; C.R. Ottermann; K. Bange
- Book ID
- 113284827
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 469 KB
- Volume
- 97
- Category
- Article
- ISSN
- 0168-583X
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