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Thickness dependent surface microstructure evolution of bismuth thin film prepared by molecular beam deposition method

โœ Scribed by Youngkun Ahn; Young-Hwan Kim; Seong-Il Kim; Kwang-Ho Jeong


Book ID
116337632
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
632 KB
Volume
12
Category
Article
ISSN
1567-1739

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