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Thickness dependent properties of sputtered a-Si:H from Raman and conductivity measurement

✍ Scribed by Bernard Ranchoux; Didier Jousse; Jean-Claude Bruyere; Alain Deneuville


Book ID
118332329
Publisher
Elsevier Science
Year
1983
Tongue
English
Weight
182 KB
Volume
59-60
Category
Article
ISSN
0022-3093

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