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Thickness-dependent morphologies of thin Ag films on GaAs(110) as revealed by LEED and STM

✍ Scribed by G. Neuhold; L. Bartels; J.J. Paggel; K. Horn


Book ID
117217090
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
905 KB
Volume
376
Category
Article
ISSN
0039-6028

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Thickness dependent morphology and resis
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## Abstract The morphology and electrical resistivity of ultrathin Al metal films grown on (111) Si substrates using molecular‐beam epitaxy have been investigated. For thickness <60 nm, the film morphology consists of a two‐dimensional network of Al islands, which grows via Volmer–Weber mechanism.