✦ LIBER ✦
Thickness Dependent Loss Function of Si with 0.14 eV Energy Resolution
✍ Scribed by M. Stöger-Pollach; C. Hebert; H.W. Zandbergen; P. Schattschneider
- Publisher
- John Wiley and Sons
- Year
- 2004
- Tongue
- English
- Weight
- 291 KB
- Volume
- 6
- Category
- Article
- ISSN
- 1438-1656
No coin nor oath required. For personal study only.
✦ Synopsis
Si band gap spectra were recorded by using electron energy loss spectrometry with very high energy resolution of 0.14 eV using a transmission electron microscope with a monochromated electron source. The shape of the spectra change with thickness, becoming indistinct at very thin regions. But even for higher thicknesses structureal evolution of the spectra can be observed. A comparison with band structure calculations is given, too.