Thickness Dependences of Resistivity and Temperature Coefficient of Resistance for Ge Thin Films Sandwiched between Si Layers for Uncooled Infrared Imaging Sensor

✍ Scribed by Yamaki, Kazuhiro; Tai, Takashi; Kinoshita, Junichi; Sekino, Shoji; Nakamura, Shin; Yoshitake, Tsutomu; Furukawa, Akio

• Book ID: 120051162
• Publisher: Institute of Pure and Applied Physics
• Year: 2011
• Tongue: English
• Weight: 622 KB
• Volume: 50
• Category: Article
• ISSN: 0021-4922
• DOI: 10.1143/JJAP.50.125801