Thickness dependence of transformation characteristics of Ni–Mn–Ga thin films deposited on alumina: Experiment and modeling

✍ Scribed by V.A. Chernenko; M. Kohl; M. Ohtsuka; T. Takagi; V.A. L’vov; V.M. Kniazkyi

• Publisher: Elsevier Science
• Year: 2006
• Tongue: English
• Weight: 273 KB
• Volume: 438-440
• Category: Article
• ISSN: 0921-5093
• DOI: 10.1016/j.msea.2006.02.055