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Thickness dependence of the total magnetic moment per atom in the Cu/Ni/Cu/Si(001) system

✍ Scribed by Hope, S.; Lee, J.; Rosenbusch, P.; Lauhoff, G.; Bland, J. A. C.; Ercole, A.; Bucknall, D.; Penfold, J.; Lauter, H. J.; Lauter, V.; Cubitt, R.

Book ID: 124170165
Publisher: The American Physical Society
Year: 1997
Tongue: English
Weight: 243 KB
Volume: 55
Category: Article
ISSN: 1098-0121
DOI: 10.1103/PhysRevB.55.11422

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