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Thickness dependence of refractive index and optical gap of PMMA layers prepared under electrical field

✍ Scribed by V. Švorčík; O. Lyutakov; I. Huttel


Book ID
106397816
Publisher
Springer US
Year
2007
Tongue
English
Weight
286 KB
Volume
19
Category
Article
ISSN
0957-4522

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Total internal reflection (TIR) and attenuated total reflection (ATR) measurements in the Kretschmann configuration have been performed at 25 8C with poly(methyl methacrylate) (PMMA) films (of ca. 2.5 lm thickness) spincoated on top of a 50 nm thick gold layer, as a function of the applied hydrostat