Thickness dependence of planar Hall resistance and field sensitivity in NiO(30 nm)/NiFe(t) bilayers

✍ Scribed by D.Y Kim; C.G Kim; B.S Park; C.M Park

• Book ID: 114223288
• Publisher: Elsevier Science
• Year: 2000
• Tongue: English
• Weight: 115 KB
• Volume: 215-216
• Category: Article
• ISSN: 0304-8853
• DOI: 10.1016/s0304-8853(00)00229-8